Metrology is the science of measuring, characterizing, and analyzing materials. Within metrology, there are several technologies used to detect material defects on a very small scale – precision on ...

The latest short science news items from C&EN. This story was updated on Jan. 17, 2020, to correct the affiliation for Hongzhou Lu. Lu works at Citic Metal, not at the University of Science and ...

Defect Engineering Strategies for Enhancing LDH-Based OER Catalysts. This schematic summarizes the key electronic defect engineering approaches used to boost the oxygen evolution reaction (OER) ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

It's been 37 years since scientists first demonstrated the ability to move single atoms, suggesting the possibility of designing materials atom by atom to customize their properties. Today there are ...